Scanning electron microscopy (SEM)

The FlexSEM 1000 is a rapid and easy to use variable pressure SEM amenable to imaging both conductive and insulating specimens

Quick Overview

  • High resolution surface imaging of solids, powders, films, fibres, nanoparticles
  • Investigate morphology of surfaces such as texture and roughness
  • Particle size analysis
  • Film/coating thickness
  • Elemental identification and compositional analysis
  • Imaging can be performed on conductive and non-conductive samples/substrates
  • Secondary electron (SE) detector for max resolution imaging at high vacuum
  • Back-scatter electron (BSE) detector for high material contrast imaging at high and low vacuum
  • Ultra-variable detector (UVD) for high resolution imaging at low vacuum and cathodoluminescence (CL) imaging
  • Energy-dispersive X-ray spectroscopy (EDX) for elemental identification and mapping
  • Elemental range from boron (5) to californium (98)
  • Can accept specimens up to  50 mm diameter and 40 mm thickness.

Samples must be:

  • Free from moisture and oils
  • Adhered onto a substrate or to double-sided conductive adhesive tape
  • Ideally conductive for best results
  • Preferably mounted on SEM pin stubs, but the FlexSEM has many flexible mounting options, please discuss with the instrument manager

The FlexSEM can be operated by researchers or on a fee for service basis by MCFP platform staff. Trained users can book through the MCFP iLab booking system.

Access MCFP

The FlexSEM is managed by Dr Anders Barlow. Find his profile and contact information below.

Anders Barlow

Anders Barlow

Academic Specialist - Electron and Ion Microscopy

Anders leads the Electron and Ion Microscopy and Vibrational Spectroscopy nodes of the MCFP. He is a materials and surface analysis specialist who can help you with all manner of identification and characterisation of hard and soft materials.

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