Quantitatively measure hardness, elastic modulus, and other surface mechanical properties from nanometer to micrometer scale.
The instrument can quantitatively measure hardness, elastic modulus, and other surface mechanical properties from nanometer to micrometer scale.
The Anton Paar NHT3 nanoindentation tester can apply 0.1-500 mN to samples and can measure hardness and elastic modulus. With the unique top surface referencing technique, an instrumented indentation measurement can be made immediately without waiting for thermal stabilization.
Specifications
- Force load: 0.1mN to 500 mN
- Indentation depth: shallow depths (less than 20 nm) to greater depths (up to 200 μm)
- It is easy to use for multiple advanced indentation modes: continuous multi cycles (CMC), user-defined sequences, sinus mode, advanced matrix, and multi-sample protocols.
- NHT³ is compatible with liquid testing. Its “Quick Matrix” indentation mode allows up to 600 measurements per hour with full nanoindentation curves. Its high load frame stiffness (107 N/m) and high thermal stability (raw drift rate down to 0.003 nm/s) result in high accuracy.
Access
We can train you to do your own work, collaborate or do consulting work (fee for service).
For trained users the Sputter Coater is available on the MCFP's iLab Booking System. Please contact Tian Zheng to arrange access or training.
Sample Preparation
For further advice please reach out to Tian Zheng.
Additional Resources
Anton Paar website introducing NHT3
See Also
-
Cypher AFM
The Cypher is currently the highest resolution AFM on the market.
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Scanning electron microscopy (SEM)
The FlexSEM 1000 is a rapid and easy to use variable pressure SEM amenable to imaging both conductive and insulating specimens
-
Contact angle and surface tensiometry
Contact angle measuring device for the measurement of the static and the dynamic contact angle, the surface free energy of solids, and the surface and the interfacial tension of liquids.