Static and dynamic contact angle, surface free energy of solids, and surface and interfacial tension of liquids
The OCA 20 enables the reduction of subjective factors and time involved for contact angle measurements in research, quality and production inspection.
Specifications
- Maximum sample size (LxWxH): 22 x 22 x 7 cm
- Range of contact angle measurement: 0 to 180° ; ± 0.1° measuring accuracy of the video system
- Range of surface and interfacial tension 1x10-2 to 2 x103 mN/m; resolution: min. ± 0.05 mN/m
Access
We can train you to do your own work, collaborate or do consulting work (fee for service).
For trained users the Cypher is available on the MCFP's iLab Booking System. For new users to this instrument, please contact Tian below to arrange training.
Sample Preparation
Please contact Tian to discuss about the sample preparation for your material.
Additional Resources
Tian Zheng
Academic Specialist - Nanomaterials Characterisation
Tian leads the nanomaterials characterisation (NMC) node of the MCFP. She can provide insight into all modes of modern atomic force microscopy measurements on a range of samples from nanomaterials to biological structures.
See Also
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Cypher ES AFM
High resolution (sub-nanometre) imaging, viscoelasticity mapping, electrical properties
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Hirox RH-2000 2D/3D microscope
High resolution imaging (HD/HDRI) and video recording (RGB/BW)
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Confocal Raman Microspectroscopy
The Renishaw inVia Qontor confocal Raman microscope is capable of spectroscopy, mapping and live focus/topography tracking