Electron and Ion Microscopy

High resolution surface imaging and nanoscale milling and patterning

  • Scanning electron microscopy (SEM)

    The FlexSEM 1000 is a rapid and easy to use variable pressure SEM amenable to imaging both conductive and insulating specimens

  • Helium ion microscopy and dual-beam nanofabrication

    The Zeiss ORION NanoFab is an advanced scanning ion microscope that utilises an interchangeable dual-ion beam (helium and neon) for nanofabrication and sub-nanometre imaging

  • Sample Preparation

    We have flexible sample preparation capability for electron and ion microscopy including drying, ion polishing and sputter coating