High resolution surface imaging and nanoscale milling and patterning
Scanning electron microscopy (SEM)
The FlexSEM 1000 is a rapid and easy to use variable pressure SEM amenable to imaging both conductive and insulating specimens
Helium ion microscopy and dual-beam nanofabrication
The Zeiss ORION NanoFab is an advanced scanning ion microscope that utilises an interchangeable dual-ion beam (helium and neon) for nanofabrication and sub-nanometre imaging.