Sample Preparation
We have flexible sample preparation capability for electron and ion microscopy including drying, ion polishing and sputter coating
Critical Point Drying
The drying of biological specimens such as pollen, tissue, plants, insects, as well as industrial samples, for example MEMS (Micro Electro Mechanical Systems) for SEM analysis can be prepared in the Leica EM CPD300 Critical Point Dryer, fully automatically.
Ion Polishing and Cross-Sectioning
The Triple Ion Beam Milling System, EM TIC 3X allows production of cross sections and planar surfaces for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations. With the EM TIC 3X you achieve high quality surfaces , revealing the internal structures of the sample.
Sputter Coating
The Quorum Q150T S is a turbo-pumped sputter coater for deposition of metal coatings for SEM and thin film applications. Au, Pt, and Cr targets available.
See Also
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Scanning electron microscopy (SEM)
The FlexSEM 1000 is a rapid and easy to use variable pressure SEM amenable to imaging both conductive and insulating specimens
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Helium ion microscopy and dual-beam nanofabrication
The Zeiss ORION NanoFab is an advanced scanning ion microscope that utilises an interchangeable dual-ion beam (helium and neon) for nanofabrication and sub-nanometre imaging