Tian Zheng

Academic Specialist - Nanomaterials Characterisation

Tian leads the nanomaterials characterisation (NMC) node of the MCFP. She can provide insight into all modes of modern atomic force microscopy measurements on a range of samples from nanomaterials to biological structures.

Tian Zheng
Dr Tian Zheng, Academic Specialist, MCFP Nanomaterial Characterisation (NMC) Node

Tian has a background in atomic force microscopy (AFM) and nanomaterial characterisation. In 2017, she joined University of Melbourne as the platform support officer for the Nanomaterial Characterisation Node in MCFP. She has experience in AFM sample preparation, morphological imaging, mechanical characterisation and a range of functional imaging modes for both nanomaterials and biological samples.

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Recent and Featured Publications

Tian can provide expertise in these areas

  • Cypher ES AFM

    High resolution (sub-nanometre) imaging, viscoelasticity mapping, electrical properties

  • MFP-3D AFM

    High resolution imaging of large samples in multiple scanning probe microscopy modes

  • Anton Paar NHT3 Nanoindenter

    Nanoindentation of hard materials with a calibrated Berkovich diamond tip

  • DataPhysics optical contact angle

    Static and dynamic contact angle, surface free energy of solids, and surface and interfacial tension of liquids

  • Hirox RH-2000 2D/3D microscope

    High resolution imaging (HD/HDRI) and video recording (RGB/BW)

  • ICP-MS

    The NexION 2000 is an advanced inductively coupled quadrupole plasma mass spectrometer (ICP-MS) that enables elemental or isotopic quantification in a broad range of sample types

  • Quorum Q150T Sputter Coater

    Turbo-pumped metal coater for SEM sample preparation and thin film applications