Anders Barlow
Academic Specialist - Electron and Ion Microscopy
Anders leads the Electron and Ion Microscopy and Vibrational Spectroscopy nodes of the MCFP. He is a materials and surface analysis specialist who can help you with all manner of identification and characterisation of hard and soft materials.
Anders' background is in materials characterisation and surface chemical analysis. After his PhD he spent 4 years in the UK at a national XPS service laboratory, during which time he was introduced to the helium ion microscope. In 2016 he returned to Australia and joined La Trobe University continuing to apply his experience in surface analysis until in 2018 he joined the MCFP as the HIM specialist. Anders supports researchers in the application of helium ion microscopy to novel challenges in micro and nanoscale imaging of soft materials.
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Recent and Featured Publications
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Sketch and Peel Focused Ion Beam Patterning of Black Phosphorus for Mid-Infrared Photonics
H. Liu et al. with Anders Barlow in Advanced Optical Materials
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Investigating the penetration of a plasma polymer film into porous silicon with helium ion microscopy
K. Jarvis et al. with Anders Barlow in Surface and Coatings Technology
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Dynamic Interface Printing
C. Vidler et al. with Anders Barlow in Nature
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Diffraction of polar molecules at nanomasks with low charge density
K. Simonović et al. with Anders Barlow in Phys. Rev. Research
Anders in the News
Anders can provide expertise in these areas
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Helium ion microscopy and dual-beam nanofabrication
The Zeiss ORION NanoFab is an advanced scanning ion microscope that utilises an interchangeable dual-ion beam (helium and neon) for nanofabrication and sub-nanometre imaging
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Scanning electron microscopy (SEM)
The FlexSEM 1000 is a rapid and easy to use variable pressure SEM amenable to imaging both conductive and insulating specimens
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Confocal Raman Microspectroscopy
The Renishaw inVia Qontor confocal Raman microscope is capable of spectroscopy, mapping and live focus/topography tracking
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Fourier Transform Infrared Microscopy
The Bruker LUMOS FTIR spatially maps absorption in the infrared spectrum
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X-ray diffraction (XRD)
X-ray diffraction provides information on the structure of your material
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X-ray fluorescence (XRF)
X-ray fluorescence provides information on the elemental composition of your material
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Sample Preparation
We have flexible sample preparation capability for electron and ion microscopy including drying, ion polishing and sputter coating