Sketch and Peel Focused Ion Beam Patterning of Black Phosphorus for Mid-Infrared Photonics
Huan Liu, Anders Barlow, Alexander Corletto, Christopher R. Hall, James Bullock, Shi Tang, Sivacarendran Balendhran, Seyed Saleh Mousavi Khaleghi, Sergey Rubanov, Trevor A. Smith, Yaping Dan, Kenneth Crozier
Advanced Optical Materials (2025) https://doi.org/10.1002/adom.202500460
Black phosphorus (BP) is an important mid-infrared semiconductor, having a direct bandgap from monolayer (≈1.7 eV) to bulk (≈0.31 eV) thicknesses. The ability to nanopattern BP could enable new optoelectronic devices. However, existing nanopatterning techniques are either limited to thin flakes or produce BP with poor optical properties. Here, focused neon ion beam lithography is used to produce functional BP nanostructures. We demonstrate a “sketch and peel” method. The “sketch” step removes BP in a narrow line that outlines the desired structure. In the “peel” step, a hardened polymer droplet is used as a handle to pull off the surrounding flake. The “sketch and peel” method minimizes the damage to BP. We show that thermal treatment allows the small amount of damage that still occurs to be mitigated, as confirmed by Raman spectroscopy and mid-infrared photoluminescence. For the first time, this work demonstrates a method to nanopattern BP with very high resolution and to repair damage by producing high quality BP nanostructures. It thus could be an important enabling technology for future BP nanophotonic devices.
Our expertise and capabilities in this research
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Anders Barlow
Anders leads the Electron and Ion Microscopy and Vibrational Spectroscopy nodes of the MCFP. He is a materials and surface analysis specialist who can help you with all manner of identification and characterisation of hard and soft materials.
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Helium ion microscopy and dual-beam nanofabrication
The Zeiss ORION NanoFab is an advanced scanning ion microscope that utilises an interchangeable dual-ion beam (helium and neon) for nanofabrication and sub-nanometre imaging