MFP-3D AFM

High resolution imaging of large samples in multiple scanning probe microscopy modes

This instrument is ideal for many applications including physics, material science, polymers, chemistry, nanolithography, bioscience, and quantitative nanoscale measurements.

The instrument is placed in an acoustic isolation enclosure which provides excellent acoustic protection, low frequency passive vibration isolation and protects the instrument from air currents. This AFM is set up on a Herzan antivibration (granite top).

Specifications

  • Maximum image size x/y: 90 µm, z: 15 µm
  • Maximum sample size: 6 cm (if your sample is bigger please contact us to discuss about it)
  • Resolution: 5 Å in the  X and Y directions and 0.6 Å in the Z direction
  • Manufacturer: Asylum Research/Oxford Instruments

Choose this instrument for:

  • Large closed loop scan area
  • Compatibility with inverted optical microscopes
  • Sample viewing from top and bottom
  • Long-range, low-noise force measurements
  • Flexible mounting for various sample shapes and sizes
  • Quantitative nanoindentation

Access

We can train you to do your own work, collaborate or do consulting work (fee for service).
For trained users the MFP-3D is available on the MCFP's iLab Booking System. The instrument is booked per session.

  • Morning session: 8am-1pm
  • Afternoon session: 1pm-6pm

Access MCFP

Sample preparation

In the process of sample preparation for AFM it is very important to minimise dust and contamination.
Our facility has a specific area for samples preparation, with two laminar flow cabinets, and all materials required.
For further advise on sample preparation please contact Tian below.

Tian Zheng

Tian Zheng

Academic Specialist - Nanomaterials Characterisation

Tian leads the nanomaterials characterisation (NMC) node of the MCFP. She can provide insight into all modes of modern atomic force microscopy measurements on a range of samples from nanomaterials to biological structures.

View profile