High resolution imaging of large samples in multiple scanning probe microscopy modes

This instrument is ideal for many applications including physics, material science, polymers, chemistry, nanolithography, bioscience, and quantitative nanoscale measurements.
The instrument is placed in an acoustic isolation enclosure which provides excellent acoustic protection, low frequency passive vibration isolation and protects the instrument from air currents. This AFM is set up on a Herzan antivibration (granite top).
Specifications
- Maximum image size x/y: 90 µm, z: 15 µm
- Maximum sample size: 6 cm (if your sample is bigger please contact us to discuss about it)
- Resolution: 5 Å in the X and Y directions and 0.6 Å in the Z direction
- Manufacturer: Asylum Research/Oxford Instruments
Choose this instrument for:
- Large closed loop scan area
- Compatibility with inverted optical microscopes
- Sample viewing from top and bottom
- Long-range, low-noise force measurements
- Flexible mounting for various sample shapes and sizes
- Quantitative nanoindentation
Access
We can train you to do your own work, collaborate or do consulting work (fee for service).
For trained users the MFP-3D is available on the MCFP's iLab Booking System. The instrument is booked per session.
- Morning session: 8am-1pm
- Afternoon session: 1pm-6pm
Sample preparation
In the process of sample preparation for AFM it is very important to minimise dust and contamination.
Our facility has a specific area for samples preparation, with two laminar flow cabinets, and all materials required.
For further advise on sample preparation please contact Tian below.
Tian Zheng
Academic Specialist - Nanomaterials Characterisation
Tian leads the nanomaterials characterisation (NMC) node of the MCFP. She can provide insight into all modes of modern atomic force microscopy measurements on a range of samples from nanomaterials to biological structures.
AFM Image Gallery
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Topography of CTAB Micelles on Silica Sample provided by JJ Imaged on Cypher S AFM -
Elastic Modulus and Topography of Geopolymer Concrete Sample courtesy of Dr. Rackel San Nicolas Image taken on Cypher S AFM -
Atomic Resolution of Calcite in H2O Sample provided by Dr Cathy Sutton Imaged on Cypher S AFM -
Topography and Phase of Block Copolymer P2VP-PDMS Sample provided by Chao Chen Image captured by Cypher S AFM -
Topography of nanochannels produced on the NanoFrazor Explore Syetem Sample provided by Dr Srinivas Mettu Imaged on Cypher S AFM -
Piezoresponse force microscopy (PFM) lithography of PVDF film
See Also
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Cypher ES AFM
High resolution (sub-nanometre) imaging, viscoelasticity mapping, electrical properties
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Hirox RH-2000 2D/3D microscope
High resolution imaging (HD/HDRI) and video recording (RGB/BW)
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Scanning electron microscopy (SEM)
The FlexSEM 1000 is a rapid and easy to use variable pressure SEM amenable to imaging both conductive and insulating specimens