Jupiter XR AFM

Large-sample AFM with no compromise on performance

The Oxford Instruments Jupiter XR is a large sample AFM with remarkable throughput and ease of use.

Specifications

Maximum image area x/y: 100 µm, z: 5 µm.
Sample stage compatible with samples up to 6-inch wafers
Vertical resolution (Z): <0.05 nm, Lateral resolution (X/Y): Sub-angstrom level (probe-dependent)
Manufacturer: Asylum Research/Oxford Instruments

Choose this instrument for

Closed loop imaging from tens of microns down to atomic scales
Small cantilevers for high-speed scanning
High-speed, low-noise force measurements
High-bandwidth data acquisition
Automated laser alignment
Fast Force Mapping

Typical applications

Nanomaterials & thin films
Polymers & soft matter
Semiconductor & device characterisation
Biological samples
Surface/interface analysis

Access

We can train you to do your own work, collaborate or do consulting work (fee for service).
For trained users, the Cypher is available on the MCFP's iLab Booking System. The instrument is booked per session.

Morning sessions: 9am-11am, 11am-1pm
Afternoon sessions: 1pm-3pm, 3pm-5pm

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Sample preparation

In the process of sample preparation for AFM it is very important to minimise dust and contamination.
Our facility has a specific area for samples preparation, with two laminar flow cabinets, and all materials required.
For further advise on sample preparation please contact Tian below.

Tian Zheng

Academic Specialist - Nanomaterials Characterisation

Tian leads the nanomaterials characterisation (NMC) node of the MCFP. She can provide insight into all modes of modern atomic force microscopy measurements on a range of samples from nanomaterials to biological structures.

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