Atomic Force Microscopy
Atomic Force Microscopy (AFM) is an incredibly powerful method used in materials characterisation. In the past four decades since its inception it has been adopted widely throughout academic and industrial research labs, to help scientists visualise and inspect materials/surfaces, to map nanomechanical and electrical properties.
In this module we will introduce you to the basic concepts of the AFM. You will learn:
- What is an Atomic Force Microscope
- How is AFM applied in research
- Its strengths and weaknesses
- How an AFM works, including different modes of operation, probes, and data acquisition channels
- How to get the best results from an AFM
How to navigate MCFP Learning
You can follow through this course in order by clicking the blue buttons at the end of each section, like the one below. You can also navigate directly to sections of interest within a course by using the context menu on the left (or at the top if you are on a mobile device). You can return home via the menu at the top or the green button at the bottom of each page.